Publikationen von M. Kelsch

Jin-Phillipp, N.Y.; Kelsch, M.; Sycha, M.; Thomas, J.; Rühle, M.: Cross-sectional TEM study on metal/carbon nanotube interface. In: Proceedings Microscopy and Microanalysis 2004, Suppl. 2, S. 280CD - 281CD (Hg. Anderson, I.M.; Price, R.; Hall, E.; Clark, E.; McKernan, S.). Microscopy and Microanalysis 2004, Savannah, Georgia, USA, 01. August 2004 - 05. August 2004. Press Syndicate of the University of Cambridge, New York, USA (2004)